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TDG01
Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
Grating description |
Structure: |
- glass wafer
- the grating is formed on the layer of chalcagenid glass
- the grating top surface is aluminium |
Pattern types: |
1- Dimensional (in the X or Y direction) |
Pattern height: |
> 55 nm provides good image contrast |
Geometry: |
parallel ridges |
Period: |
278 nm (3600 periods/mm) |
Accuracy: |
±1nm |
Size: |
diameter 12,5 mm, thickness - 2,5 mm |
Effective area: |
central diameter 9 mm. |
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